Match! Update Page

Latest Update

The most recent version is 4.0 (Build 306) released on July 15, 2024.

If you are still using an earlier version and your update permission time has not expired yet (which can both be checked by selecting "About Match!" from the "Help" menu), we strongly recommend to update to the current version. This can easily be achieved by performing the following steps:

1. If Match! is running, please save any open documents and close the program.
2. Please DO NOT uninstall the previous version before installing the new version! Instead, simply install the new version on top of the existing version. This is important to make sure that your license file is retained.
3. Download the installer file for your platform (Windows, macOS, Linux) from the Download page, and uncompress ("unzip") it if necessary.
4. Make sure that you have administrator privileges on multi-user systems, then run the installer by double-clicking on it. More details about this topic are given in the platform-specific "Readme" files that are also available from the Download page.
5. Follow the steps in the installer until it has finished, then restart Match!.
6. Check whether the update was successful by selecting "About Match!" from the "Help" menu.

Enhancements in version 4.0 (Build 306)

• When the first phase is selected as "matching", Match! now automatically displays the profile calculated from selected phases as well as the corresponding difference plot in the pattern graphics (see new option below).
• There is a new option "Switch to 'Selected phases' on selection of first matching phase or PFSM calculation" on the "Graphics" tab of the "Options" window. It toggles the automatic "switching over" to the display of the profile calculated from selected phases.
• A new option "Activate difference plot on selection of first matching phase or PFSM calculation" has been added on the "Graphics" tab of the "Options" window. It toggles the automatic activation of the difference plot.
• A new option for selecting the search-match method to be used in batch processing has been added to the "Batch" tab of the "Options" window.
• The new option "Display phase names in addition to formula sum in pie charts graphics" has been added on the "Quant. analysis" page of the "Options" window.
• The option "Switch to 'Composition' display (pie charts) after selection of the first/second phase" has been removed from the "Batch" tab of the "Options" window, because a more or less equivalent option "Automatically switch over to the pie chart graphics after performing a quantitative analysis" is already available on the "Quant. analysis" tab.
• The "Selected phases" and "Exp. peak data" options on the "Graphics" tab of the "Options" window have swapped their positions.
• The "Background" chapter in the Match! online help has been reworked.
• The new version has been verified to be compatible with all upcoming release 2025 ICDD PDF database products.
• Several bugs have been fixed:
  • Some bugs that might have caused Match! to crash in certain situations (e.g. when loading documents or performing "Undo" operations) have been fixed.
  • Due to a bug, the accuracy of the determined peak positions was reduced during peak searching if the peaks were very broad (FWHM > 2.0 degrees 2theta).
  • A bug causing the diffraction pattern graphics not to be erased completely at "File / New" has been fixed.
  • The automatic selection of matching phases did not work if profile fitting search-match was applied.
  • The name of the selected restraints preset was not stored along with user-defined option settings on the "Batch" tab of the "Options" window.

Enhancements in version 4.0 (Build 299)

• A bug affecting the copying of the match list to the clipboard when the candidate list is empty has been fixed.
• Due to a bug, the y-axis scale marks of the difference plot sometimes overlaid the y-axis marks of the diffraction pattern above.
• Due to a bug, the peak list was not displayed in certain circumstances.
• Some minor bugs have also been fixed.
• The latest edition 2024.06.03 of the COD reference database is included.

Enhancements in version 4.0 (Build 295)

• Profile-fitting search-match (PFSM) is now available, as an alternative to the classical search-match based on peak data. PFSM tries to fit the profile calculated from every candidate entry in the reference database to your experimental diffraction pattern. PFSM can be run using the new menu command "Search / Search-match using profile fitting".
• Improved handling of entries without I/Ic value in quantitative RIR analysis, e.g. when using the ICDD PDF-2 database: Missing I/Ic values in the match list can now be calculated from imported crystal structure data (CIF) or entered manually.
• New menu command "Quantify / Rietveld refinement (FullProf)" uses the currently selected schedule (-> Rietveld options) to perform an automatic Rietveld refinement calculation for quantitative analysis.
• New "Quantitative analysis" options "Show quantitative analysis method in pie chart graphics title" and "Automatically switch over to the pie chart graphics after performing a quantitative analysis"
• New menu command "Entries / Automatic entry selection" selects matching phases automatically. The minimum required Rwp reduction (that is also used for automatic selection of entries) can be adjusted in the "PF search-match" section on the "Search-Match" tab of the "Options" window.
• New menu command "Edit / Copy candidate list" copies the current contents of the candidate list at the bottom left into the clipboard, in order to insert it into some other program (e.g. Microsoft Excel).
• New menu command "Edit / Copy match list" copies the current contents of the match list (phases selected as 'matching') at the bottom right into the clipboard, in order to insert it into some other program (e.g. Microsoft Excel).
• Continuous display of already found results during normal (peak-based) search-match
• For macOS there now are separate versions for ARM (Apple Silicon) and Intel processors. This significantly increases the calculation speed on Apple Silicon while at the same time reducing the memory overhead.
• Demo version has new signature, so that the Match! 4 demo version can be run for 60 days even if the Match! 3 demo version has expired.
• An issue causing background control points to be no longer shiftable or removable once they got too close to each other has been resolved.
• A bug affecting the recalculation of the degree-of-crystallinity (DOC) has been fixed.
• Another bug sometimes affecting the peak position accuracy in peak searching has been resolved.
• There was a bug affecting the "1/d"-scaling of the x-axis in the pattern graphics that has been fixed by now.