Software for Scientists Register   Contact    Follow us on Twitter    Search
About us Diamond Endeavour Match! Pearson's CD  
About Match!
Function list...
Brochure...
References...
Get Match!

Order Now

Download

Evaluate Match! with a time-limited demo version free-of-charge.

Reference Patterns

Download reference patterns calculated from the COD free-of-charge.
Support
Videos
Updates
Previous versions
Online help
Manual
Tips & Tricks
Known bugs
Frequently Asked Questions
Version 3 Support
Download
Videos
Updates
Previous versions
Online help
Manual
Tips & Tricks
Known bugs
Frequently Asked Questions
Version 2 Support
Download
Updates
Videos
Tips & Tricks
Known bugs
Frequently Asked Questions
Version 1 Support
Download
Updates
Tips & Tricks
Known bugs
Frequently Asked Questions

 

Match! is an easy-to-use software for phase analysis using powder diffraction data. It compares the diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Additional knowledge about the sample like known phases, elements or density can be applied easily.
In addition to this qualitative analysis, a quantitative analysis (using Rietveld refinement) can be performed as well. You can easily setup and run Rietveld refinements from within Match!, with the actual calculations being performed automatically, using the well-known program FullProf (by J. Rodriguez-Carvajal) in the background. Match! provides a gentle introduction into Rietveld refinement, from fully automatic operation to the "Expert" mode. The software runs natively on Windows, macOS and Linux.

Version 4 now provides profile fitting search-match (PFSM) as a powerful alternative to the proven peak-based search-match. Watch a video showing the new profile fitting search-match functionality in action, or take a closer look at this screenshot:

Screenshot showing the new profile fitting search-match function in action

Just like with earlier versions of Match!, you can apply the included free-of-charge COD database, use any ICDD PDF product as reference database, and/or create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak files, calculated from crystal structure data (e.g. CIF files), or imported from your colleague's user database.
A list of Match!'s most prominent features can be found here.

Demonstration Version

If you are interested in evaluating Match!, you can download a time-limited demonstration version free-of-charge.

Brochure

A product brochure including feature list, system requirements and prices is available for download.

Match! News

July 15, 2024
The new Match! version 4.0 Build 306 provides both new functions and options as well as fixes for all currently known bugs. More...

July 11, 2024
Match! has been verified to work with all upcoming release 2025 versions of the ICDD PDF databases.

June 3, 2024
A new edition of the COD reference database for Match! (now containing more than 512,000 entries!) has become available for download from here.

February 9, 2024
You can now watch a video showing the new profile fitting search-match functionality in action!

News archive...