Software for Scientists Register   Contact    Follow us on Twitter   Follow us on Google+    Search
About us Diamond Endeavour Match! Pearson's CD  
About Match!
Function list...
Brochure...
References...
Get Match!

Order Now

Download

Evaluate Match! with a time-limited demo version free-of-charge.

Reference Patterns

Download reference patterns calculated from the COD free-of-charge.
Support
Videos
Updates
Previous versions
Tips & Tricks
Known bugs
Frequently Asked Questions
Version 2 Support
Download
Updates
Videos
Tips & Tricks
Known bugs
Frequently Asked Questions
Version 1 Support
Download
Updates
Tips & Tricks
Known bugs
Frequently Asked Questions

Match! Update Page

Latest Update

In order to make sure that your Match! software is always "up-to-date", you should visit this page from time to time, especially if you have deactivated the "Automatic Online Update" option.

The current version is 3.3 released October 4, 2016.

If you are still using an earlier version (which can be checked by selecting "About Match!" from the "Help" menu), we strongly recommend to update to the current version. This can easily be achieved by performing the following steps:

  1. If Match! is running, please save any open documents and close the program.
  2. Please DO NOT uninstall the previous version before installing the new version! Instead, simply install the new version on top of the existing version. This is important to make sure that your license file is retained.
  3. Download the installer file for your platform (Windows, Mac OS X, Linux 32-bit and 64-bit) from the Download page, and uncompress ("unzip") it if necessary.
  4. Make sure that you have administrator privileges on multi-user systems, then run the installer by double-clicking on it. More details about this topic are given in the platform-specific "Readme" files that are also available from the Download page.
  5. Follow the steps in the installer until it has finished, then restart Match!.
  6. Check whether the update was successful by selecting "About Match!" from the "Help" menu.

Enhancements in version 3.3

  • Crystallite size estimation using Scherrer's formula (menu "Tools/Crystallite size estimation...")
  • New command for batch scripting: "crystallite_size_estimation(name_of_standard,Scherrer_constant)"
  • New option "Estimate crystallite size" on "Batch"-tab of the "Options"-dialog
  • New option "Draw peak positions incl. relative intensities" on the "Graphics"-tab of the "Options"-dialog toggles between display of peak positions and the display of a "small stick pattern", i.e. peaks with positions and relative intensities as well as entry label.
  • Stick pattern can now be displayed in data sheets (new option on "Data sheet" tab of "Options" dialog).
  • The peak searching algorithm has been improved. You may want to re-adjust (normally reduce) your default peak searching sensitivity (Tools/Raw data/Peak searching).
  • You can now adjust the FWHM of one or more marked peaks directly in the pattern graphics, by moving the mouse cursor on top of one of them (cursor will change) and turning the mouse wheel up or down.
  • The command "View in Diamond" now also displays the refined crystal structure (if present).
  • A new option "Monochromator" has been added to the Rietveld Parameter Turn-On dialog, so that the FullProf parameter CTHM can now be adjusted.
  • For Rietveld refinement, you can now activate the Brindley correction for the microabsorption on the phase sub-tabs (tab "Quant.") on the "Expert" tab of the "Parameter Turn-On" dialog. For the calculation of the Brindley parameters you can enter a value for the particle size separately for every phase.
  • It is now possible to export the data sheet (original or refined data) of the currently marked entry to a pdf-file.
  • When another experimental pattern is added using the "Load as experimental" command, the corresponding sample ID will now also contain the entrynumber as well as the formula sum, in addition to the name of the compound that has already been used up to now.
  • A new file 3-column format (d/2theta, intensity, FWHM) for the export of peak data has become available.
  • The display quality (resolution) on Apple HiDPI (Retina) devices has been significantly improved.
  • The command "Load as experimental" has been added to the context menu of the Match list.
  • Stripping of alpha2 contribution is no longer performed automatically by default during automatic raw data processing.
  • A clarification has been added to the dialogs for the zero-point and specimen-displacement correction.
  • Several bugs have been fixed:
    • A bug causing error messages like "Unable to determine one or more scaling factors!" when trying to run a Rietveld refinement calculation has been fixed.
    • The command "Export peak data (Rietveld)" was not available due to a bug.
    • Some minor bugs have been fixed as well.

Enhancements in version 3.2.2

  • A new option "Determine automatically" has been added for the "Default FWHM" setting on the "Raw data" tab of the "Options" dialog. If this option is active (and raw/profile diffraction data are present), Match! will determine an average default FWHM value automatically while running the normal peak searching. Otherwise, the default FWHM value given by the user will be applied to all peaks that have been found/imported.
  • Using the new option "Amounts (%)" for the legend in the diffraction pattern you can now toggle the displaying of the results of the semi-quantitative analysis for all Match list entries in the legend of the diffraction pattern graphics.
  • The default value for Cp, the Rietveld microabsorption coefficient, has been changed from 1.0 to 0.0.
  • The option "Update candidate list during search-match" has been moved from the "General" to the "Candidate list" tab of the "Options" dialog.
  • The option "Include marked candidate list entries in profile calculation" has been moved from the "General" to the "Candidate list" tab of the "Options" dialog.
  • Several bugs have been fixed:
    • Due to a bug, no atomic coordinates were available when using the PDF-4/Organics database. Re-indexation of the reference database is required to fix the problem!
    • Match! crashed when the user tried to import a diffraction data file containing the old Mac line endings (CR only) in the diffraction data file.
      Although Match! does no longer crash, these files are still not imported yet, so please make sure to convert the line endings either to LF or CR/LF in your text editor, then try again!
    • A bug causing the command "Export profile data (Rietveld)" sometimes being not available has been fixed.
    • An issue causing the background curve to "jump" when moving a background control point (sometimes causing "steps" in the background curve) has been resolved.
    • Due to a bug, several diffraction data files in Siemens UXD file format (*.uxd) could not be imported.
    • A bug leading to peak intensity scaling problems after Rietveld refinement calculations has been resolved.
    • In certain circumstances (e.g. with phases containing elements with large scattering power), a Rietveld refinement calculation could not be run because of an error message "Unable to determine one or more scaling factors!"
    • The initial values for the Rietveld scaling factors were far off reasonable values in some circumstances.
    • In some circumstances, the error message "Correlated peak not found" was displayed again and again when the peak searching sensitivity was reduced (menu command or F3).
    • Due to a memory leak, loading or importing of large user databases or large entry numbers in the User Database Manager could cause a crash of the program.
    • A bug caused the program to crash when running the "Delete all peaks" command if at least one entry was present in the Match list (i.e. selected as matching).
    • Several minor bugs have been fixed as well.

Enhancements in version 3.2.1

  • The initial dialog asking a new user to select the path to his FullProf installation is now displayed later on (if required) when the user wants to run a Rietveld refinement calculation for the first time.
  • The header of the "intensity" column in the peak list now gives the exact type of values ("Peak height" or "Integrated intensity"), depending on the scaling of the y-axis in the pattern graphics as "relative intensities (I rel.)" (peak heights scaled to a maximum 1000.0) or "Counts" (-> integrated peak intensities)).
  • In the Match list, quantitative amounts of phases for which the default I/Ic-value had to be used (because the corresponding entries did not contain a I/Ic-value), are now displayed in red color (instead of the former '(*)' indicator that was used up to now).
  • Several bugs have been fixed:
    • Some intensity scaling issues in the pattern graphics have been resolved.
    • A bug affecting the command "File/Print/Data sheet" has been fixed.
    • The sorting of the Match list according to the quantitative amounts did not work properly if the default I/Ic-value of 1.0 was used for at least one of the phases.
    • In certain circumstances, Match! was unable to find the "Diamond" program on Windows PCs.
    • Some minor bugs have been fixed as well.

Enhancements in version 3.2.0

  • The reference database is now switched automatically when a document is loaded that was saved using a different reference database than the one that is currently used.
  • New batch script command "new_document" (-> File/New)
  • New batch script command "use_ref_db" (select reference database from within script), e.g. use_ref_db("PDF-2 Release 2015")
  • A data sheet for the refined structure and parameters has become available, in addition to the one for the original reference database entry data.
  • New data sheet option "Display peak positions as 2theta or d-values" on new "Data sheet" options tab
  • New command "Pattern/Increase resolution" increases resolution by interpolating new data points between the original ones.
  • New option "mode" for peak range selection on "Peaks" tab of "Restraints" and "Additional entries" tabs enables the user to exclude all entries that have peaks within certain 2theta ranges.
  • New command "File/Export/Peak data (Rietveld)" exports the peak data resulting from Rietveld refinement from the currently marked Match list entry.
  • Auto save option on the "General" tabsheet of the "Options" dialog (default: active, save every 10 minutes).
  • The import of cif-files into the User Database Manager is much faster by now.
  • Peak searching sensitivity has been slightly improved (some users may want to adjust their default peak searching sensitivity)
  • A new page "Batch Scripting" has been added to the online help in which all commands available for scripting are listed and explained along with their parameters.
  • Several bugs have been fixed:
    • Due to a bug, Match! did not distinguish between U_iso and B_iso when importing isotropic atomic displacement parameters from ICDD PDF-4+ databases.
    • A severe bug in the figure-of-merit calculation devaluated an entry if at least one of its peaks contributed only to a minor part of an experimental peak intensity.
    • A bug causing displaying problems of filenames containing more than a single '.' character has been fixed.
    • Due to a bug, changing the restraints pre-selection did not always lead to the expected result (some input boxes kept their previous values).
    • Peaks from reference database entries could not be correlated to experimental peaks even though they lay just a tiny bit outside the range of experimental peaks (if the corresponding option "restrict to experimental range" was active).
    • The quantitative results from Rietveld refinement were not used (copied into Match!) in certain circumstances (e.g. if no experimental peaks were detected/present).
    • Several minor bugs have been fixed as well.

Enhancements in version 3.1.1

  • New command "Peak list options..." in context menu of peak list (right-click to open)
  • Command "Internal standard" has been added to context menu of Match list (right-click to open)
  • Several bugs have been fixed:
    • A bug prohibiting the usage of PDF-2 databases released before 2011 (causing error messages like 'Cannot append to Match! protocol file " (tbl_Cellpar)') has been fixed.
    • Another issue due to which no space group information was given in the data sheets of some PDF-entries has been resolved.
    • The problem that the setting of the raw data processing options "Geometry" and "Omega" could not be saved as default has been resolved.
    • In the User Database Manager, several bugs have been fixed.

Enhancements in version 3.1.0

  • You can now edit or delete reference database entries marked in the candidate list (not possible for ICDD PDF database entries though).
  • New version of COD reference database
  • It is now possible to use entries even in non-standard settings for Rietveld refinement, provided that the corresponding space group symmetry data are present in Match!.
  • New command "Edit background" in the "Pattern" menu (shortcut )
  • You can now edit the sample IDs of additional patterns by using the corresponding new command from the pattern menus.
  • The commands "Edit/Sample ID" und "Edit/Sample Date/Time" have been moved from the "Edit" into the "Pattern" menu.
  • When importing automatic divergence slit (ADS) data, the user is now asked if he would like to convert them in fixed slit data (FDS).
  • Several bugs have been fixed:
    • A bug affecting the usage of the preferred orientation vector in Rietveld refinement calculations (vector given in Parameter Turn-On dialog was not used in FullProf script) has been resolved.
    • Two bugs affecting the keeping of reference databases while resetting Match! to its factory settings have been fixed.
    • An issue causing the displaying/reading of wrong entry data in large COD- or user reference databases has been fixed.
    • A bug causing e.g. export problems if 2 byte characters were present in the file name/path has been fixed.
    • If peak parameters were edited in the peak list during a search-match calculation that was run automatically after another peak had been edited, the program crashed.
    • Some minor bugs have been fixed as well.

Enhancements in version 3.0.3

  • Several bugs have been fixed:
    • A bug causing the "Quality" selection criteria on the "Restraints/Properties" and "Additional entries/Properties" tabs not being available has been fixed.
    • Sometimes Match! crashed during Rietveld refinement calculations if FullProf wrote "********" sequences into the result files due to overflow.
    • Due to a bug, the sign of the zero point correction changed if a Rietveld refinement did not converge or if FullProf script files were exported from the "Rietveld Parameter Turn-On"-dialog.
    • The unit of pressure in the data sheets was given as "GPa" instead of "kPa".
    • The font in the "Rietveld variable modificaton" dialogs was too large so that sometimes the explanations did not fit in completely.
    • A bug causing a modification of the default paper size when printing the pattern graphics has been fixed.
    • Some minor bugs have been fixed as well.

Enhancements in version 3.0.2

  • The peak searching algorithm has been slightly improved.
  • Automatic divergence slit data are automatically converted into fixed slit data if corresponding diffraction data are imported from XRDML-files.
  • Several bugs have been fixed:
    • Undo/redo sometimes caused unexpected results if zooming or tracking operations were performed before.
    • Due to a bug it was no longer possible to zoom in by double-clicking in the diffraction pattern.
    • A bug has been fixed that caused a problem in background calculation if the maximum intensity value of the profile data was below 5.0.
    • Some minor bugs have been fixed as well.

Enhancements in version 3.0.1

  • An import interpreter for TXRD export text files has been implemented.
  • The direction of the mouse wheel zoom has been reversed.
  • Several bugs have been fixed:
    • If a "mixed" wavelength like Cu K-alpha was used, the Miller indices (hkl) were not displayed in the pattern graphics.
    • A bug causing the default wavelength not to be applied when Match! has just been started has been fixed.
    • Peak correlations in the pattern graphics could be mixed up due to a correponding bug.
    • A bug in the peak searching code sometimes causing peaks to be not detected has been fixed.
    • A bug preventing Match! batch script files (*.mbf) from being run has been fixed.
    • The value of the FullProf parameter Cthm (monochromator polarisation correction) has been corrected.
    • Some library files were missing in the Linux installers.
    • Some minor bugs have been fixed.

Enhancements in version 3.0.0

  • New entries can now be added to the reference database straight away, without using the User Database Manager or the need to create new index files in the Reference Database Library. The new entry data can be imported from a cif-file and/or edited manually.
  • User-configurable automatic Rietveld refinement: Parameter sequence sets for up to 10 subsequent refinements can easily be created, stored and recalled later on.
  • New user level "Rietveld" that runs all steps automatically, incl. identification of the matching phases and Rietveld refinement. All the user has to do is to select the raw diffraction data file to be analyzed and wait a few seconds until the phase analysis report is displayed.
  • New specimen-displacement correction for asymmetric geometry
  • New toolbar button for "Batch" processing options
  • Order of buttons in the "Search-Match/Select entries/FullProf" toolbar has been rearranged so that it is now more logical from left to right.
  • New menu "Database" now contains all commands related to the reference database
  • Manual has been reworked and reorganized.
  • The update subscription model has been introduced.