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Evaluate Match! with a time-limited demo version free-of-charge.

Reference Patterns

Download reference patterns calculated from the COD free-of-charge.
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Match! Update Page

Latest Update

In order to make sure that your Match! software is always "up-to-date", you should visit this page from time to time, especially if you have deactivated the "Automatic Online Update" option.

The current version is 3.0.3 released November 25, 2015.

If you are still using an earlier version (which can be checked by selecting "About Match!" from the "Help" menu), we strongly recommend to update to the current version. This can easily be achieved by performing the following steps:

  1. If Match! is running, please save any open documents and close the program.
  2. Please DO NOT uninstall the previous version before installing the new version! Instead, simply install the new version on top of the existing version. This is important to make sure that your license file is retained.
  3. Download the installer file for your platform (Windows, Mac OS X, Linux 32-bit and 64-bit) from the Download page, and uncompress ("unzip") it if necessary.
  4. Make sure that you have administrator privileges on multi-user systems, then run the installer by double-clicking on it. More details about this topic are given in the platform-specific "Readme" files that are also available from the Download page.
  5. Follow the steps in the installer until it has finished, then restart Match!.
  6. Check whether the update was successful by selecting "About Match!" from the "Help" menu.

Enhancements in version 3.0.3

  • Several bugs have been fixed:
    • A bug causing the "Quality" selection criteria on the "Restraints/Properties" and "Additional entries/Properties" tabs not being available has been fixed.
    • Sometimes Match! crashed during Rietveld refinement calculations if FullProf wrote "********" sequences into the result files due to overflow.
    • Due to a bug, the sign of the zero point correction changed if a Rietveld refinement did not converge or if FullProf script files were exported from the "Rietveld Parameter Turn-On"-dialog.
    • The unit of pressure in the data sheets was given as "GPa" instead of "kPa".
    • The font in the "Rietveld variable modificaton" dialogs was too large so that sometimes the explanations did not fit in completely.
    • A bug causing a modification of the default paper size when printing the pattern graphics has been fixed.
    • Some minor bugs have been fixed as well.

Enhancements in version 3.0.2

  • The peak searching algorithm has been slightly improved.
  • Automatic divergence slit data are automatically converted into fixed slit data if corresponding diffraction data are imported from XRDML-files.
  • Several bugs have been fixed:
    • Undo/redo sometimes caused unexpected results if zooming or tracking operations were performed before.
    • Due to a bug it was no longer possible to zoom in by double-clicking in the diffraction pattern.
    • A bug has been fixed that caused a problem in background calculation if the maximum intensity value of the profile data was below 5.0.
    • Some minor bugs have been fixed as well.

Enhancements in version 3.0.1

  • An import interpreter for TXRD export text files has been implemented.
  • The direction of the mouse wheel zoom has been reversed.
  • Several bugs have been fixed:
    • If a "mixed" wavelength like Cu K-alpha was used, the Miller indices (hkl) were not displayed in the pattern graphics.
    • A bug causing the default wavelength not to be applied when Match! has just been started has been fixed.
    • Peak correlations in the pattern graphics could be mixed up due to a correponding bug.
    • A bug in the peak searching code sometimes causing peaks to be not detected has been fixed.
    • A bug preventing Match! batch script files (*.mbf) from being run has been fixed.
    • The value of the FullProf parameter Cthm (monochromator polarisation correction) has been corrected.
    • Some library files were missing in the Linux installers.
    • Some minor bugs have been fixed.

Enhancements in version 3.0.0

  • New entries can now be added to the reference database straight away, without using the User Database Manager or the need to create new index files in the Reference Database Library. The new entry data can be imported from a cif-file and/or edited manually.
  • User-configurable automatic Rietveld refinement: Parameter sequence sets for up to 10 subsequent refinements can easily be created, stored and recalled later on.
  • New user level "Rietveld" that runs all steps automatically, incl. identification of the matching phases and Rietveld refinement. All the user has to do is to select the raw diffraction data file to be analyzed and wait a few seconds until the phase analysis report is displayed.
  • New specimen-displacement correction for asymmetric geometry
  • New toolbar button for "Batch" processing options
  • Order of buttons in the "Search-Match/Select entries/FullProf" toolbar has been rearranged so that it is now more logical from left to right.
  • New menu "Database" now contains all commands related to the reference database
  • Manual has been reworked and reorganized.
  • The update subscription model has been introduced.