Crystal Impact Home  
  About us Diamond Endeavour Match! Pearson's CD  
About Match!
Function list...
Brochure...
References...
Get Match!

Order Now

Download

Evaluate Match! with a time-limited demo version free-of-charge.

Reference Patterns

Download reference patterns calculated from the COD free-of-charge.
Support
Videos
Updates
Previous versions
Tips & Tricks
Known bugs
Frequently Asked Questions
Support for version 1
Download
Updates
Tips & Tricks
Known bugs
Frequently Asked Questions

Match! Update Page

Latest Update

In order to make sure that your Match! software is always "up-to-date", you should visit this page from time to time, especially if you have deactivated the "Automatic Online Update" option.

The current version is 2.4.3 released June 25, 2015. If you are still using an earlier version (which can be checked by selecting "About Match!" from the "Help" menu), we strongly recommend to update to the current version. This can easily be achieved by performing the following steps:

  1. If Match! is running, please save any open documents and close the program.
  2. Please DO NOT uninstall the previous version before installing the new version! Instead, simply install the new version on top of the existing version. This is important to make sure that your license file is retained.
  3. Download the installer file for your platform (Windows, Mac OS X, Linux 32-bit and 64-bit) from the Download page, and uncompress ("unzip") it if necessary.
  4. Make sure that you have administrator privileges on multi-user systems, then run the installer by double-clicking on it. More details about this topic are given in the platform-specific "Readme" files that are also available from the Download page.
  5. Follow the steps in the installer until it has finished, then restart Match!.
  6. Check whether the update was successful by selecting "About Match!" from the "Help" menu.

Enhancements in version 2.4.3

  • The algorithm for the calculation of the figure-of-merit value (FoM, used in search-match calculations) has been slightly modified, in order to prohibit entries with many low intensity peaks to show up at the top of the candidate list even though most of their strong peaks could not be correlated to experimental peaks.
  • The search-match option "Check 3 strongest peaks..." is now deactivated by default, in order to eliminate a problem of overlooking phases if one of its three strongest peaks has not been detected.
  • A full search-match calculation is now performed after each selection of a matching entry. This eliminates the problem that entries that were not present in the candidate list right from the beginning did not show up there even if the candidate list was becoming shorter during phase selections. Please note that this may slow down certain operations (compared to the previous FoM-update of just the current candidate list entries), especially if the "Check 3 strongest peaks..." option is not active and large reference databases (like the PDF-4) are used without e.g. composition or subfile restrictions!
  • The peak searching algorithm now also accepts shoulder peaks, thus increasing the peak searching sensitivity.
  • The automatic background determination has been improved.
  • In case of mixed alpha1/2 wavelengths (e.g. Cu Kalpha), it is no longer necessary to strip the alpha2 contribution before e.g. running a search-match.
  • The "Display" option to restrict the view to the range of the exp. diffraction pattern is now active by default.
  • The automatic Rietveld refinement algorithm has been slightly improved.
  • Value of 2theta window size for peak correlation has been added to Report.
  • Search-match option "Check entries marked as 'deleted'" was no longer in use and has been removed.
  • Several bugs have been fixed:
    • A severe problem that may have caused the omission of even major phases has been resolved. This issue may have caused a significant reduction of FoM-values even if only a single small peak could not be correlated. The problem especially became evident if the exp. peaks were rather broad (FWHM values larger than about 0.2).
    • Due to a bug, the peak searching sensitivity was affected by the height of the background radiation.
    • In certain circumstances the alpha2-stripping stopped at 2theta=120.0 degrees, sometimes causing a "step" in the raw data.
    • The calculated profile data were not updated during background subtraction.
    • A bug causing error messages like "Your Rietveld refinement did not converge...Error on Intensity file, check your instr parameter!" has been fixed.
    • Another bug also affected the Rietveld refinement, causing scale factors of "-1" to be displayed when the "Rietveld Parameter Turn-On" dialog is first opened.
    • A third bug affecting Rietveld refinement has been corrected, causing error messages that certain parameters (atomic coordinates) cannot be read from the Rietveld results if a non-standard space group setting was applied.
    • After fitting the SyCos parameter using Rietveld refinement and deactivating this parameter again, its value was reset to zero.
    • A bug affecting the option "General/Update candidate list during search-match" has been fixed.
    • When zooming out or viewing the full pattern e.g. by double-clicking the setting of the "Restrict view to exp. range" option was disregarded.
    • Closing the "Options"-dialog by pressing "Ok" (even without any changes) cleared the Candidate list.
    • When reading a Match! document file (*.mtd) that has been created using a different reference database Match! might have crashed if the Match list in the document contained one or more entries.
    • Several minor bugs have been fixed as well.

Enhancements in version 2.4.2

  • New import filter for Rigaku raw data text files (containing '*'-keywords) has been implemented.
  • When importing Rigaku raw data files, you can now check and maybe adjust the wavelength given in the file.
  • A bug affecting the bibliographic data section in the data sheets of old PDF-2 database entries (release before 2005) has been fixed.
  • Some minor bugs have been fixed.

Enhancements in version 2.4.1

  • Title, radiation source element and hkl-values are now written to Stoe PKS files
  • A new chapter "Searching for Entries (Restraints and Additional Entries)" has been added to the Tutorial Handbook. In this chapter, the searching for specific phases/entries as well as the usage of selection criteria for restrainting and adding of specific entries are explained.
  • Several bugs have been fixed:
    • A bug causing incorrect (too low) counts and amount (%) values of individual phases in the "Calculate profile integrals" dialog has been fixed. The problem became apparent if at least one of the selected entries/phases contained peaks only in a narrow 2theta range or only up to low 2theta values.
    • Double-clicking on a diffraction data file on Windows opened the Match! program, but the diffraction data file was not imported.
    • The code for the import of 2-column raw data files (either "2theta intensity" or "d-value intensity") contained a bug that caused a smoothing of the raw data in certain circumstances.
    • If you load a document that has been created using a different reference database than the one that you currently using, the following "Restraints" and "Additional entries" criteria are now reset automatically: entry number, original entry number, quality marks and subfiles.
    • A couple of minor issues has been fixed as well.

Enhancements in version 2.4.0

  • The stacking distance between diffraction patterns can now be reduced step by step up to a complete overlap with the anchor pattern at the bottom. In order to do so, press the Ctrl- (Cmd-) key along with '-' (or '+' vice versa), run the corresponding command(s) from the View/Pattern menu, or move the mouse cursor to the right of the diffraction pattern and turn the mouse wheel.
  • For each additional pattern, a menu button now provides access to commands like "Close pattern", "Swap patterns" etc.
  • It is now possible to add or subtract two patterns, by using the corresponding new commands from the new pattern menu (see above).
  • You can quickly define an "additional experimental pattern" to be the new anchor pattern (the one that is used for search-match etc)., by using the corresponding command from the new pattern menu (see above).
  • You can now import more than a single diffraction pattern at a time, simply by marking several files in the "Import diffraction data"-dialog.
  • The search-match option "Restrict to exp. range" has been replaced by two separate options, one for the low angle and one for the right (high angle) part of the diffraction pattern.
  • You can now define a minimum value for the intensities of peaks to be correlated. By increasing this value you can exclude minor phases which may be reasonable when beginning a new phase identification.
  • The individual profile integrals of matching phases (% and counts) are now displayed in the "Pattern/Calculate profile integrals" dialog.
  • There is a new search-match parameter "Minimum relative intensity for peak correlation".
  • When resetting Match! to its factory settings the current reference databases can now be retained.
  • The function to load an entry that is currently marked in the candidate list as a new experimental pattern has been extended so that now not only the peak data are copied but also a profile curve is calculated from them, using the current default FWHM value.
  • The pattern recording temperature is now also printed in the legend of the pattern graphics.
  • The "Internal standard" functionality has been improved/corrected.
  • In the "Experimental details" dialog that is displayed when importing diffraction data from some file formats, you can now also select "theta" (in addition to "2theta" and "d-value"), making it possible to e.g. import Seifert diffraction data.
  • New support for DRON-3 diffraction data file format (still experimental)
  • A variety of bugs has been fixed:
    • If you were using the PDF-4/Minerals reference database and tried to run a Rietveld refinement you got an error message "Entry does not contain crystal structure data", despite the fact that this database contains full crystal structure data (incl. atomic coordinates).
    • When using a PDF reference database, the checkbox "Inorganics only" on the "Composition"-tab of the "Restraints" page did not work properly: Marking the checkbox resulted in the answer set containing 0 entries.
    • In some cases FullProf did not use the standard setting for a space group, resulting in Rietveld refinement problems because diffraction peaks were e.g. missing. This has been fixed by now by using the Hall-symbol instead of the Hermann-Mauguin symbol in the FullProf control file. Please note that you also have to install the latest version of FullProf in order to fully resolve this problem!
    • An issue affecting the Rietveld refinement of crystal structures containing mixed site has been resolved.
    • Intensity scaling factors could not be modified independently using the mouse in the diffraction pattern: If the intensities (i.e. scaling factor) of one phase were increased, the intensities (scaling factors) of the remaining phases were decreased automatically and vice versa.
    • Quite often the program crashed if the difference plot was opened too slowly when using the mouse in the diffraction pattern (on the x-axis) for this task.
    • If only a small experimental 2theta-range was present or large parts of the 2theta-range were marked as "excluded", the search-match calculation did not work properly.
    • In the "Add peak"-dialog, the button "Add peak" was never enabled.
    • A bug affecting the saving of the Report as a Textfile (*.txt) has been fixed.
    • The checkbox "Inorganics only" on the "Composition" page of the "Restraints" tab did not work when using ICDD PDF reference databases.
    • Some minor bugs have been fixed.

Enhancements in version 2.3.3

  • It is now possible to perform the specimen displacement correction using the mouse wheel: Simply keep the Shift-, Alt- und Ctrl- (Cmd on the Mac) buttons pressed, then turn the mouse wheel up or down (similar to zero point correction using Alt- and Ctrl-button).
  • You can now export and import the current settings and options to/from a file using the corresponding new commands in the "Tools" menu. This can be helpful e.g. in order to transfer your favorite settings to another computer.
  • If (semi-)quantitative results are present in a Match list column, they are now also displayed in the legend of the diffraction pattern graphics.
  • The memory usage/consumption has been optimized, improving the handling/usage of large reference databases like the PDF or the full COD.
  • A new import filter for XPowder (*.plv) files has been added.
  • The new version has been verified to run on the upcoming Mac OS X 10.10 "Yosemite".
  • A variety of bugs has been fixed:
    • Printing was not possible on Windows 7 and 8 64-bit systems
    • A bug causing large memory consumption and "run-time error" messages during Search-Match/FoM-Update calculations has been fixed
    • Several bugs affecting specimen displacement correction (some in combination with Rietveld refinement) have been fixed.
    • There was a bug in the alpha2-stripping code that caused an overcompensation in some cases.
    • The import of Rigaku raw data files was affected by an issue that caused the wavelength to be always set to a monochromatic value (e.g. Cu K-alpha 1) even though a alpha 2 contribution was also present.
    • Due to a bug the setting of the option "Experimental range only" could not be made permanent. Each time a new diffraction pattern was imported or a new document created, this option was reset to its factory setting.
    • Several bugs affecting the permanent storage of settings and options have been fixed.
    • A bug affecting the command "Load as experimental" has been fixed (automatic color selection)
    • The modification of the quantitative amounts in the Match list using the mouse wheel or keyboard did not work as expected.
    • The manual modification of the intensity scaling factors using the mouse in the diffraction pattern was affected by a bug.
    • Some minor bugs have been fixed as well.

Enhancements in version 2.3.2

  • New/updated COD reference database (July 30, 2014) included in installer packages
  • Several bugs have been fixed:
    • A bug affecting Rietveld refinements using FullProf on some Windows systems has been fixed.
    • On Windows systems, the pattern graphics was not displayed in the Report even though the corresponding option was active.
    • Restrainting or adding entries using the crystal system as criterion did not work (use new COD or re-run reference database indexation to fully resolve this issue!)
    • Some minor bugs have been fixed as well.

Enhancements in version 2.3.1

  • A bug causing problems when using the old PDF-2 reference databases has been fixed. In order to fully resolve this problem, you should run a new reference database indexation for the PDF-2 in the "Reference Database Library".
  • In addition, a few minor bugs have been fixed.

Enhancements in version 2.3.0

  • You can now display X-ray spectral lines of the radiation source (e.g. K-alpha2, K-beta) around the mouse cursor position.
  • New look-and-feel: Match! has been ported to using the new Qt 5.3 library.
  • Linux 64-bit version has become available in addition to the 32-bit version.
  • Open diffraction data files by dragging/dropping them on the Match! icon or window.
  • Open Match! document files (*.mtd) by double-clicking on them.
  • Demo version signature has been modified, so that the new version can be used even if you had tested Match! 2 somewhen in the past.
  • Several bugs have been fixed:
    • On some Windows versions the status bar was hidden by the task bar by default.
    • A bug affecting Rietveld refinement (e.g. if user name contains blank characters) has been fixed.
    • The data sheet was not marked in certain circumstances even though an entry was marked in the Candidate or Match list.
    • Several minor bugs have been fixed as well.

Enhancements in version 2.2.3

  • Peak searching sensitivity has been improved
  • Several bugs have been fixed:
    • In certain circumstances the data sheet and/or report were not displayed.
    • A bug that prevented the intensity scaling factors from being larger than 1.0 has been fixed.
    • If a reference pattern was marked in the candidate or match list whose 2theta-range was larger than the one of the experimental pattern, the 2theta-range displayed in the pattern graphics was not reset even if the marking was removed.
    • Some minor bugs have been fixed as well.

Enhancements in version 2.2.2

  • New command "Peaks/Scale intensities" rescales the relative peak intensities to a maximum value of 1000.0 (useful e.g. after peak addition by mouse)
  • New command "Peaks/Refill residuals" restores the original available relative intensity values that have been reduced e.g. due to the application of the automatic residual searching.
  • Buffer size has been significantly reduced (especially when using large reference databases like the PDF), leading to much smaller document files as well as faster Undo/Redo operations and more stability.
  • Command "Delete incomplete entries" has been improved and works much faster by now.
  • Default peak searching sensitivity has been adjusted.
  • Default automatic optimization of peak searching sensitivity has been disabled.
  • Several bugs have been fixed:
    • Specimen displacement correction value was not mentioned in the report.
    • The data sheet was not displayed on some machines/platforms.
    • Diffraction data below 2theta=1.0 degree could not be displayed. This boundary has now been reduced to a minimum 2theta-value of 0.1 degree.
    • The checkbox "Entries must contain full crystal structure" on the "Structure" restraints tab did not work properly.
    • Some minor issues have been resolved

Enhancements in version 2.2.1

  • You can now copy the diffraction pattern graphics into other programs like Microsoft Word or Excel using the clipboard, by pressing <Ctrl+C> or using the menu "Edit/Copy pattern graphics".
  • New command "Delete incomplete entries" in "Entries" menu and toolbar removes entries that do not contain a complete crystal structure description and are hence not usable for Rietveld
  • refinement calculations.
  • It is now possible to use '*' wild card characters in text restraints like 'Name', 'Space group', 'Color' or 'Author', in order to run text fragments searching. Without wildcard character(s), the exact match is required by now. In contrast to this, the "Search/Find phase/entry(s)..." command still uses text fragment searching by default.
  • New toolbar style on Mac OS X
  • The keyboard shortcut for zeropoint correction has been modified from <Ctrl+C> to <Ctrl+Shift+C>.
  • If a PDF reference database was used, the program might have crashed every now and then. This issue has been fixed by now.
  • Inel rawdata files containing count values > 1.0E6 could not be imported in previous versions; this problem has been resolved as well.
  • Some minor bugs have been fixed.

Enhancements in version 2.2.0

  • Profile area integrals can now be displayed e.g. using the "Calculate profile integrals..." command in the "Pattern" menu.
  • Peak residuals can now be displayed e.g. using the "Calculate peak residuals..." command in the "Peaks" menu.
  • New match list option "Display unidentified peak area / residual intensity"
  • New report options "Integrated profile areas" and "Peak residuals"
  • New match list context menu entry "Match list options..."
  • You can now define excluded pattern ranges using the new "Exclude ranges..." command in the "Pattern" menu.
  • Peak searching algorithm has been improved.
  • Background determination code has been improved.
  • New Rietveld parameter "Profile shape parameters for all phases" on "Beginner"-tab of the Rietveld parameter turn-on dialog
  • Automatic Rietveld refinement has been improved.
  • New dialog "Select preferred user level" ('Beginner' or 'Expert') displayed at first program startup
  • The panel for status bar messages is much wider now, because the licensee information is now displayed in the same panel.
  • Several bugs have been fixed
    • A severe bug in the background determination code has been fixed.
    • If the minimum number of correlated peaks on the search-match options tab was set to a value > 3, no more matching entries were found.
    • In Rietveld refinement we have switched the space group information in the FullProf control files back to Hermann-Mauguin-symbols, because using the symmetry matrices (as introduced in Match! version 2.1.3) turned out not to work properly in all cases.
    • A bug affecting the Rietveld refinement of the 2theta shift has been fixed.
    • In certain circumstances the default setting of the "Display background" option was not retained.
    • When the "Options"-dialog was closed with activated "Save as defaults" option, a selection criteria preset called "Options/SaveAsDefaults" was created by mistake.
    • A variety of minor bugs has been fixed as well.

Enhancements in version 2.1.4

  • Parameters of manually added peaks (optionally 2theta, intensity and/or FWHM) are now fitted to the profile data automatically.
  • The 2theta- and intensity axis unit as well as the wavelength can now be modified by clicking on the corresponding labels in the diffraction pattern graphics.
  • Experimental peaks can now also be marked and shifted by (right-)clicking on the corresponding peak position marks below the diffraction pattern.
  • A warning message is now displayed if the user selects a FullProf version that is older than the recommended release April 2013.
  • Several bugs have been fixed:
    • On some OS X versions (like Mavericks (10.9)), the online help could not be opened, due to some missing library files.
    • If peaks were added manually (either using dialog or mouse) right after a new document has been opened/created, the color of the peaks was black; other errors or program crashs might have followed.
    • A bug affecting the Rietveld refinement of atomic parameters (coordinates etc.) has been fixed.
    • If a Rietveld parameter value was modified using the "Modify Rietveld Variable" dialog, the new value was not accepted/stored.
    • If no difference plot was displayed ever before, either the peak difference or the profile difference was displayed at random when the difference plot was opened in the pattern graphics using the mouse.
    • We have fixed a bug in the export function for profile data in the "start, step, end, intensities"-format that caused too few data points to be written.
    • Bugs in the XRDML- as well as the G670/Huber-import filter have been resolved.
    • A bug preventing the loading of a Match! document file (.mtd) by double-clicking on it was fixed (Windows version).
    • Several minor bugs have been fixed as well.

Enhancements in version 2.1.3

  • On Windows, you can now display the crystal structure of the currently marked entry in "Diamond", e.g. by pressing the corresponding new button in the main toolbar.
  • In the Rietveld parameter turn-on dialog, the number of active parameters is now displayed at the top of the 'Table of active parameters'.
  • In Rietveld refinement, the symmetry matrices are now written to the pcr-files, in order to avoid problems with wrong settings / origin choice resulting from ambiguous space group symbols.
  • Several bugs have been fixed:
    • A bug that caused a failure of the 'Reset' function in the Rietveld parameter turn-on dialog has been fixed.
    • The "File/Open/Import"-dialog was displayed even though Match! had been run with the name of a batch script file given as "command line" argument.
    • The mouse cursor in the pattern graphics was not reset if the "vertical line" option was active.
    • The modification of the height of the difference plot using the mouse did not work properly.
    • Several minor bugs have been fixed.

Enhancements in version 2.1.2

  • You can now display the peak d-values of marked reference entries in the pattern graphics.
  • New Rietveld option "Previous" for "Which tab (user level) shall be displayed first..."
  • Rietveld options have been re-arranged in the "Options"-dialog
  • New option "Shift on 2theta axis (zero point)" on tab "Beginner" in the Rietveld parameter turn-on dialog
  • Minor improvements in Rietveld parameter turn-on dialog
  • New button/function "Reset" in the "Reference Database Library" removes all current reference databases but the COD that was installed along with Match!. This function can also be used to cope with reference database issues (e.g. see the bug below).
  • Default color for Rietveld profile data has been changed in order to improve visibility.
  • Several bugs have been fixed:
    • A severe issue affecting the reference database library has been fixed which caused duplicate reference databases and other issues for user-specific reference databases.
    • On Mac OS X it was not possible to run Rietveld refinement if FullProf was installed in a directory other than the default "Applications" folder.
    • An issue affecting the checkbox "unit cell parameters" on the "Advanced" tab of the Rietveld parameter turn-on dialog has been resolved.
    • A bug in the import code for XRDML files has been fixed that e.g. caused problems in Rietveld refinement.
    • After a Rietveld refinement calculation had been run, the difference plot was not switched over to "Rietveld".
    • A variety of minor issues (most of them affecting Rietveld refinement) have been resolved.

Enhancements in version 2.1.1

  • Warning message concerning background determination problems can now be switched off on the 'General' tab of the 'Options'-dialog.
  • The FullProf environment variable is now also used for the automatic determination of the path to FullProf.
  • Several bugs especially affecting the new Rietveld refinement feature have been fixed.
  • Some minor bugs have been fixed as well.

Enhancements in version 2.1.0

  • Rietveld refinement calculations can be setup, run and evaluated from within Match! (using FullProf internally to actually perform the calculations)
  • Signatures of demo version have been modified. Hence, even users who have run the Match! version 2 demo version in the past and which has expired by now are able to test the new version.
  • New command "File/Export/Refined structure" (also in Match list context menu) exports crystal structure data resulting from Rietveld refinement to cif-files
  • New command "File/Export/Profile data (Rietveld)" exports the calculated profile data from Rietveld/FullProf
  • New menu command "Pattern/Recalculate background" (available if background has been modified manually)
  • Miller indices are now also exported along with COD entry data if file format "Text file (*.txt)" is chosen.
  • Batch preset term "Manual" changed to "User defined" (please reset to factory settings to activate)
  • Several bugs have been fixed:
    • A severe issue preventing the import/indexing of the ICDD WebPDF-4+ reference database has been resolved.
    • Another severe bug that caused a crash of the program when loading a Match! document file that was created using the PDF-4 database has been fixed.
    • In certain circumstances the smoothing of the raw data was much too strong.
    • Changing the value/slider for the number of smoothing cycles during the automatic raw data processing did not have any effect.
    • If a set of entries was loaded into the Match list using the "Import predefined selection" command, only the first entry was really loaded.
    • If the "Batch" option "Run search-match calculation if update of FoM-values is required" was active, adding or deleting peaks resulted in wrong peak correlations.
    • A manually defined/corrected background curve was replaced by the automatically determined background when commands like "Smooth raw data" were run.
    • Changing the default FWHM value on the "Raw data" page of the "Options" dialog was a little bit "tricky".
    • Some minor bugs have been fixed.

Enhancements in version 2.0.12

  • Several bugs have been fixed:
    • When using the PDF-4 reference database a bug might cause a crash of the program when selecting entries.
    • The manual background adjustment has been improved.
    • When using a PDF reference database, the name of an entry selected as "matching" was not displayed in the corresponding column of the Match list.
    • If a peak had been marked and deleted in the Peak list before, it was not possible to mark the same line (now containing the next peak) again.
    • When using a wavelength other than Cu K-alpha there were problems in FoM calculation and pattern display in certain circumstances.
    • Some issues affecting the User Database Manager have been resolved.
    • Some minor bugs have been fixed.

Enhancements in version 2.0.11

  • Several bugs have been fixed:
    • The loading of additional diffraction data in Bruker RAW4 file format did not work.
    • In certain circumstances there was no reaction to running the raw data processing or peak searching commands.
    • A bug causing an error message after creating a new reference database has been resolved.
    • Fixed a bug in the Windows version due to which a new reference database that was created "for all users" was not available to normal (standard) users.
    • Some minor bugs have also been fixed.

Enhancements in version 2.0.10

  • Phase names in the Match list can now be edited by double-clicking on the corresponding field
  • New option "[Automatically] Run search-match calculation if update of FoM-values is required" on "Batch" tab of the "Tools/Options" dialog. You may have to run "Tools/Restore default settings" to adjust the "user level" settings in the options dialog!
  • Several bugs have been fixed:
    • A bug in the diffraction data file format recognition code in certain circumstances mismatched the 2-column peak data and the 2-column profile data format.
    • A couple of issues affecting Match list operations like double-clicking have been resolved.
    • Some minor bugs have been fixed.

Enhancements in version 2.0.9

  • Modification of background curve has been improved: You can now adjust control points close to the edges of the pattern, and the control point size has been increased.
  • Export of experimental peak data to text file (2-column *.dif or Stoe *.pks).
  • UTF-7 encoding of XRDML diffraction data files is now also supported.
  • When reading .esg diffraction data files, a dialog will now be displayed in which the wavelength can be confirmed or corrected.
  • Several bugs have been fixed:
    • In the "Add Peaks" dialog the button "Add peak" was not available in certain circumstances.
    • Some logical conflicts affecting the "Save as defaults"-option of the "Colors and Line Styles"-dialog have been removed.
    • A bug in the User Database Manager has been fixed that caused the diffraction pattern graphics to be empty if the wavelength was changed.
    • Another bug in the User Database Manager caused an error message "Invalid user database format" after the current user database had been saved by pressing the "Save" button.
    • Some minor bugs have been fixed.

Enhancements in version 2.0.8

  • Export of profile data in 2-column format is now also available as 2theta vs. intensity
  • Several bugs have been fixed:
    • If the option "Vertical line at mouse cursor position" was active, the program stopped working if a search-match or update calculation for the FoM-values was carried out.
    • Several bugs affecting the table "Your personal reference databases" in the Reference Database Library dialog have been fixed.
    • Some issues of the User Database Manager causing problems in its entry table (e.g. when deleting entries) have been resolved.
    • Several minor bugs have been fixed.

Enhancements in version 2.0.7

  • Several bugs have been fixed:
    • If a large reference database (like the full COD or the PDF) was used, the Match! document files became very large. Besides this, the program might crash e.g. during/after the search-match calculation. Both issues have been resolved.
    • Sometimes the program crashed if a peak was added after a document file has been loaded or the "Undo" command was run.
    • A bug affecting the loading of version 1 document files containing excluded ranges has been fixed.
    • Some minor bugs have been fixed.

Enhancements in version 2.0.6

  • The import of background profile data is now possible ("File/Import/Background")
  • You can now export the background profile data in two different FullProf formats (*.bac)
  • Cubic splines background calculation/modification has been improved.
  • New/modified commands "Tools/Restore default settings" and "Tools/Reset to factory settings"
  • Several bugs have been fixed:
    • The profile fitting did not have any effect.
    • A bug in the import filter for MDI raw data files (*.mdi) has been fixed which prohibited the recognition/import of files in this format.
    • A bug affecting the displaying of Miller indices (hkl) in the diffraction pattern has been fixed.
    • Sometimes the peaks were not displayed if the calculated profile option was not active.
    • In certain circumstances it was not possible to export profile or other data to a file, because Match! created an illegal proposition for the file name internally that caused the "File / Save" dialog not to open.
    • Several bugs affecting the loading of Match! version 1 document files have been resolved.
    • Several minor bugs have been fixed.

Enhancements in version 2.0.5

  • The smoothing of raw data has been significantly improved.
  • The number of repetitions of the smoothing algorithm application can now be adjusted for automatic raw data processing.
  • New command "Import predefined phase selection" allows the user to directly define the matching entries, by loading the corresponding entry numbers from a Match! answer set file (*.mta). This is especially helpful if series of similar samples have to be investigated.
  • The settings of the "Export pattern graphics" dialog (e.g. graphics resolution) can now be saved as default values.
  • Several bugs have been fixed:
    • A bug affecting the import of Stoe raw data files on Windows PCs has been fixed.
    • When presets containing a lot of information (e.g. entry numbers) were loaded, the program sometimes crashed.
    • In certain circumstances, the program crashed during the indexing of a new reference database.
    • A bug in the "Find entry" code has been fixed.
    • Some minor bugs have been fixed.

Enhancements in version 2.0.4

  • New command "File/Export/Answer set (Match list)" to export the current entries in the Match list to a Match! answer set file (*.mta)
  • Support for new diffraction data file format "G670" (*.gdf)
  • Several bugs have been fixed:
    • A bug that prevented the adjustment of the width and height of exported pattern graphics images has been fixed.
    • The problem that on Windows and Linux machines the pattern graphics image could not be exported to JPEG- and TIFF-files has been resolved.
    • On Linux machines, all user defined settings that were saved "as defaults" were reset when the program was closed. This issue has been resolved, however, please note that at first you have to manually remove the file

      ".config/Crystal\ Import/Match\!\ 2.conf"

      in your home directory (if present), using administrator rights ("root","sudo"), and install the new Match! version afterwards, in order to fully resolve this issue!
    • The directory in which a pattern graphics file was exported was not stored.
    • An issue has been resolved that caused an error message being displayed when a user tried to open a user database file (*.mtu) that has been created on a different computer.
    • When importing Inel raw data files, a shift/error in the 2theta values might have been applied by accident.
    • Some non-ASCII characters were not displayed correctly in the splash screen.
    • Some minor bugs have been fixed as well.

Enhancements in version 2.0.3

  • Several bugs have been fixed:
    • Fixed a bug causing the user-defined default colors and line styles not to be retained.
    • The user-defined peak searching sensitivity for profile fitting as well as the default wavelength were not retained.
    • An issue affecting the import of monoclinic crystal structure data from cif-files (causing error message "Space group could not be identified") has been resolved.
    • Some minor bugs have been fixed.

Enhancements in version 2.0.2

  • Several bugs have been fixed:
    • A work-around has been implemented that will enable the reading of most version 2.0.0 document files that were corrupted due to a bug in version 2.0.0
    • When using the PDF database, an incorrect error message might have been displayed at program startup.
    • A missing Linux library has been added; afterwards, the program was run successfully also on Linux 64-bit (tested with openSUSE 12.1 64-bit).
    • Some minor bugs have been fixed.

Enhancements in version 2.0.1

  • Several bugs have been fixed:
    • There was no reaction (changes in the candidate list) upon changing the search-match parameters.
    • The "peak position" restrainting did not work (only 0 or 1 entry was found).
    • In the online help on Windows and Linux, several icons and symbol pictures (e.g. mouse cursors) were missing.
    • A bug in the Ital Structures (*.esg) import filter has been fixed.
    • There was a bug in the import code for Bruker RAW4 files that prevented the import of diffraction data files containing more than one pattern.
    • An issue in the import code for Stoe RAW files was resolved.
    • The "1/d"-representation of the diffraction pattern did not work if an entry was marked in the candidate or match list.
    • The "recent files" list in the "File" menu did not include diffraction pattern files.
    • The option "Experimental range only" on the "Graphics" page of the Tools/Options- dialog did not work properly.
    • If a document file contained more than one diffraction pattern, the program crashed when loading it.
    • Several issues when loading a document created using a different reference database have been fixed.
    • On Mac OS X, the "swap patterns" and "delete pattern" buttons for additional diffraction patterns did not work.
    • If cif-files that were imported into the User Database Manager contained errors, the corresponding error message file was not displayed after the import on Windows and Linux.
    • A severe bug in the User Database Manager's cif-import code was fixed that prevented the import of crystal structure data containing standard deviation data for floating point values
    • The selection criterion "Quality" was available on the "Properties" tabsheets even for the COD reference database, causing a crash of the program when being used
    • An issue in the online update code has been resolved.
    • Several minor bugs have been fixed.