Match! Online Help

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Contents

• Welcome to Match!
• Match! 3 Basics
  • The working area
  • Diffraction data
    • Basics
    • Table of Experimental Diffraction Patterns
    • Import
      • File formats
      • Experimental details
      • Background import
    • Zoom
    • Tracking
    • Peak editing
    • Delete all peaks
    • Profile area integrated intensities
    • Peak residual calculation
    • Rescale relative peak intensities
    • Refill residual peak intensities
    • Exclusion of pattern areas
    • Calculation of profile data
    • Options
  • Candidate list
    • Correction of 2theta error (internal standard)
    • Selection of matching entries
    • Options
  • Match list
    • Basics
    • Manual phases/entries
  • Peak list
    • Basics
    • Peak editing
  • Data sheet
  • Report
    • Basics
    • Print
    • Export
    • Options
  • Export of data
    • Profile data
    • Profile data (Rietveld/FullProf)
    • Peak data
    • Peak list
    • Candidate list
    • Residual peaks
    • Pattern graphics
    • Answer set
    • Reference pattern
    • Entry data
    • Crystal structure in Diamond
    • Refined structure (Rietveld/FullProf)
    • Report
  • Printing
  • Finishing
  • Session/document storage
  • Undo/Redo
• Raw data processing
  • Trim diffraction pattern
  • alpha2-stripping
  • Background determination and subtraction
  • Raw data smoothing
  • Peak searching
  • Profile fitting
  • Peak searching sensitivity
  • Zero point correction
  • Correction for specimen-displacement error
  • Automatic raw data processing
  • Increase pattern resolution
• Qualitative analysis (search-match)
  • Figure-of-merit (FoM) calculation
  • Matching Phases Selection
    • Evaluation of candidate entries
  • Restraints application
  • Restraints/Database Retrieval
    • Chemical composition
    • Crystal structure
    • Physical properties and quality
    • Peak positions
    • Bibliography
    • PDF Subfiles
    • List Selection Boxes
  • Additional entries
• Quantitative analysis
• Reference Intensity Ratio (RIR) method
• Direct Derivation (DD) method (H. Toraya)
• Rietveld refinement
• Degree-of-crystallinity (DOC)
• Internal standard
• Refinement calculations
• Rietveld Refinement
  • Running Rietveld/FullProf calculations using the Parameter Turn-On dialog
  • Hints, Tips and Tricks
• Pattern decomposition (Le Bail method)
• Crystallite Size Estimation
• Indexing
  • Setting Up and Running Indexing Calculations
  • Indexing Programs
    • Treor90
    • Dicvol06
  • Viewing and Analyzing Indexing Results
• Crystal structure solution using Endeavour
• Reference Pattern Database
  • Reference Database Library
    • Create Reference Database
      • Use PDF-4 or PDF-2 as Reference Database
      • Use Old Format PDF-2 as Reference Database
      • Create Reference Database From User Data or ICSD/Retrieve
      • Create Combined Reference Database
    • Select Reference Database
    • Add Reference Database
    • Rename Reference Database
    • Shift PDF-2 Reference Database
    • Delete Reference Database
  • Add new entry to reference database directly
  • Edit reference database entry
  • Delete reference database entry
  • User Database
    • The User Database Manager
      • Open user database
      • Save user database
      • Import entries
        • Import from ICSD/Retrieve
        • Import from cif-files
        • Import from user database files (*.mtu)
      • Export entry
      • Combine user database files
      • Add entry
      • Delete entry
      • Edit entry
        • Check of formula sum
        • Import diffraction data (peaks)
        • Export diffraction data
• Repeating similar analyses
• Controlling Match! using script files
• General hints for phase analysis using powder diffraction data
• Tips and Tricks
• Mouse Operations, Keyboard Shortcuts and Function Key Mappings
• Options
  • General
  • Automatic raw data processing
  • Search-Match
  • Quantitative analysis
  • Batch Processing
  • Diffraction pattern graphics
  • Peak list
  • Candidate list
  • Match list
  • Rietveld
  • Data sheet
  • Colors, line styles and fonts
    • Patterns graphics
    • Experimental data
    • Reference patterns
    • Default colors and line styles
    • X-ray spectral lines
    • Colors, line styles and fonts for other objects
• Support and contact information
• License and update permission time