Exporting Data
You can export a variety of data from Match!:
Raw/profile diffraction data
Diffraction pattern (peaks)
Calculated profile diffraction data (Rietveld/FullProf)
Reference pattern (peaks)
Entry data (incl. crystal structure data)
Refined structure (Rietveld/FullProf)
Residual peaks
(peaks remaining after selection of matching entries)
Diffraction pattern graphics
(BMP, JPG, WMF, EMF)
Answer set
Peak list
Candidate list
Report